讲座题目：An Integrated Solution for Software Testing and Quality Assurance
主讲人：W. Eric Wong 教授
主持人：陈仪香 教授
开始时间：2015-09-10 周四 9:00——11:00
讲座地址：中北校区数学馆201室
主办单位：软件学院 科技处
报告摘要：
In this talk, I will discuss our ongoing research in software testing and quality assurance, including (1) test case generation for a single software product and a family of software products, (2) software fault localization and bug fixing, (3) bad/negative testing – especially for software safety – versus good/positive testing, and (4) source code-based risk analysis.
报告人简介：
Dr. Wong received his M.S. and Ph.D. in Computer Science from Purdue. He is a Full Professor, the Director of International Outreach, and the Founding Director of Advanced Research Center on Software Testing and Quality Assurance in Computer Science at the University of Texas at Dallas (UTD). He also has an appointment as a guest researcher at NIST (National Institute of Standards and Technology), an agency of the U.S. Department of Commerce. Prior to joining UTD, he was with Telcordia Technologies (formerly Bellcore) as a senior research scientist and the project manager in charge of Dependable Telecom Software Development.
Dr. Wong is the IEEE Reliability Society Engineer of the Year for 2014. His research focuses on helping practitioners improve software quality while reducing production cost. In particular, he is working on software testing, debugging, risk analysis/metrics, safety, and reliability. He has extensive experience developing real-life industry applications from his research results. He has received research funding from multiple organizations, such as NSF, NASA, NIST, Avaya, IBM, Texas Instruments, Lockheed Martin, Raytheon, HP, NEC (Japan), and Hyundai Motor Company. He has published more than 170 papers and co-edited two books.
Dr. Wong is currently serving as the Vice President for Publications of the IEEE Reliability Society and is the Founding Steering Committee Chair of the IEEE International Conference on Software Security and Reliability (SERE). In 2015, the SERE conference and the QSIC conference (International Conference on Quality Software) merged into one large conference, QRS, with Q representing Quality, R for Reliability, and S for Security. He has served as special issue guest editor for IEEE TR, JSS, SPE, IST, SQJ, IJSEKE, etc. He is on the editorial board of both IEEE Transactions on Reliability and the Journal of Systems and Software.（个人主页：http://www.utdallas.edu/~ewong；http://paris.utdallas.edu/stqa）